The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
| Ultra-precise measuring techniques to detect variation of 10-12 ampere. |
| A total system from temperature control to data processing. |
| Completed automatic system by using up-dated computer techniques. |
| A full line up covering from laboratory uses to on-line production. |
| Calorie meter part |
Compressor driving equipment Refrigerating cycle Compressor temperature chamber Evaporator temperature chamber |
| Measuring part |
Controller Input scanner Communications interface Personal computer |
| Peripheral part |
Chiller unit Cooling water bath |
| Testing part | Exclusive test fixtures corresponding to various devices are prepared, and various testing baths are prepared corresponding to lot sizes and point number. |
| Temperature monitoring of testing bath | Temperature pattern control and stability monitoring interlocking to testing modes are executed. |
| Measuring control processing | Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer. |
| Data processing | Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted. |
| Host computer communications | Enormous quantity of data got from again processing are transferred to a host computer, and storage. Management and high grade of analytical processing can be executed. |
| Opto-electronics devise | Laser diode (short wave, long wave), Photo diode, Opto-semiconductor module, Light emitting diode, LED dot display, EL display device |
| Temperature monitoring of testing bath | Zener diode, Tantalum capacitor, Mylar capacitor, IC card, VLSI, Transistor, MOS/FET, High frequency transistor, Thermistor, Peltier element, Switching element, Superconductivity element, Hole element |
| Measuring control processing | Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer. |
| Electronic parts | Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted. |
| Instrument | Instrument for the universe, Power module |
